Selecting a Silicon Drift Detector

Use of a silicon drift detector for cathodoluminescence detection

A Detector for Fast Electron Current Measurements based on Silicon Drift Detector Technology

Solid state detectors for electron current measurements are a well-established tool in electron microscopy, especially for the detection of backscattered electrons (BSE) underneath the pole piece inside a SEM or for the measurement of transmitted electrons in STEM or TEM applications. The progress in electron microscopy over the last years has led to many interesting new applications but also t...

Gated Silicon Drift Detector Fabricated from a Low-Cost Silicon Wafer

Inexpensive high-resolution silicon (Si) X-ray detectors are required for on-site surveys of traces of hazardous elements in food and soil by measuring the energies and counts of X-ray fluorescence photons radially emitted from these elements. Gated silicon drift detectors (GSDDs) are much cheaper to fabricate than commercial silicon drift detectors (SDDs). However, previous GSDDs were fabricat...

Two-dimensional approach to fluorescence yield XANES measurement using a silicon drift detector.

The objective of this article is to describe the capability of a two-dimensional (2D) approach to X-ray absorption near-edge structure (XANES) measurement by means of a partial fluorescence yield (PFY) method. 2D-XANES measurements were achieved by using a silicon drift detector as an energy-dispersive fluorescence detector. The advantage of this technique is that it allows full surveys of X-ra...

Compton scattering artifacts in electron excited X-ray spectra measured with a silicon drift detector.

Artifacts are the nemesis of trace element analysis in electron-excited energy dispersive X-ray spectrometry. Peaks that result from nonideal behavior in the detector or sample can fool even an experienced microanalyst into believing that they have trace amounts of an element that is not present. Many artifacts, such as the Si escape peak, absorption edges, and coincidence peaks, can be traced ...